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written by the Veeco Corporate Headquarters
This guide provides background information about Scanning Probe Microscopes (SPMs).  It begins by presenting a thorough understanding of the basic concepts related to the microscopes. Issues covered range from fundamental physics of SPMs to practical capabilities and instrumentation. Examples of applications are included throughout the guide.
Subjects Levels Resource Types
General Physics
- Equipment
Modern Physics
- Condensed Matter
- Graduate/Professional
- Upper Undergraduate
- Lower Undergraduate
- Informal Education
- Reference Material
Intended Users Formats Ratings
- Learners
- Educators
- application/pdf
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Mirror:
http://web.archive.org/web/201104…
Access Rights:
Free access
Restriction:
© 2005 Veeco Instruments, Inc.
Keywords:
SPM, microscopy, nanotech
Record Creator:
Metadata instance created July 11, 2006 by Steve Maier
Record Updated:
August 9, 2020 by Lyle Barbato
Last Update
when Cataloged:
August 1, 2005
Other Collections:

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Record Link
AIP Format
Veeco, (2005), WWW Document, (https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf).
AJP/PRST-PER
Veeco, A Practical Guide to SPM: Scanning Probe Microscopy (2005), <https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf>.
APA Format
Veeco. (2005, August 1). A Practical Guide to SPM: Scanning Probe Microscopy. Retrieved August 9, 2022, from https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf
Chicago Format
Veeco. A Practical Guide to SPM: Scanning Probe Microscopy. August 1, 2005. https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf (accessed 9 August 2022).
MLA Format
Veeco. A Practical Guide to SPM: Scanning Probe Microscopy. 2005. 1 Aug. 2005. 9 Aug. 2022 <https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf>.
BibTeX Export Format
@misc{ Author = "Veeco", Title = {A Practical Guide to SPM: Scanning Probe Microscopy}, Volume = {2022}, Number = {9 August 2022}, Month = {August 1, 2005}, Year = {2005} }
Refer Export Format

%Q Veeco %T A Practical Guide to SPM: Scanning Probe Microscopy %D August 1, 2005 %U https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf %O application/pdf

EndNote Export Format

%0 Electronic Source %A Veeco, %D August 1, 2005 %T A Practical Guide to SPM: Scanning Probe Microscopy %V 2022 %N 9 August 2022 %8 August 1, 2005 %9 application/pdf %U https://www.moles.washington.edu//wordpress/wp-content/uploads/2015/04/Veeco_spm_guide_0829_05_166.pdf


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Citation Source Information

The AIP Style presented is based on information from the AIP Style Manual.

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